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Buch (Hardcover): Fachbuch
Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)
Produkt bewerten
Verlag:
Iop Publishing Ltd Unsere-Artikel-Nr.: 8DGZ7P9
EAN: 9780750333290
Auf Lager:
1
Zustellung: Mi, 12.08.2026
Versand: Kostenlos
-17.6 %
CHF 125.–
CHF 103.–
Beschreibung
In this edition of Secondary Ion Mass Spectrometry (SIMS) and its Application to Material Science the authors expand further on the principles and methods presented in the first edition. A more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. In particular the development and application of cluster ion beams, and how this has opened up a new area of materials analysis. Practical information on how to obtain high quality SIMS data, and what parameters should be used to define this are also considered. Key Features:. Update and significant extension compared to 1st edition. New chapter on data analysis. Accessible for students from different backgrounds. Includes applications across materials,.
Spezifikationen
Sprache
- Englisch
Autor
- Sarah Fearn
- Alexander Shard
Erscheinungsjahr
- 2025
Format
- Buch (Hardcover)
Anzahl Seiten
- 125